Superimposed HiPIMS and DC Power or MF
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Schematic arrangement of UP-HPPMS and DC Superimposition
Schematic arrangement of a single magnetron system powered by one HiPIMS Pulse unit with one DC power supply and one
DC power supply used for DC superimposition over a diode matching network.
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Current and Voltage dynamic measurements
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Schematic arragement of HPPMS and MF Superimposition
HiPIMS processes in oxide mode can suffer from instability problems due to arcing and “vanishing anode” effect.
Mid-Frequency (MF) processes in contrast are mostly stable; however, HiPIMS film structure
advantages can not be achieved with pure MF processes. Since MELEC GmbH pulse power supplies can be freely
synchronized in bipolar (BP) or unipolar (UP) modes, a new process modification using an
overlapped midfrequency (MF) and HiPIMS process
was developed. This process has shown significant advantages when sputtering isolating oxides like SiO2 and Al2O3.
In the case of TiO2 and ZrO2, this process works in the transition mode with feedback control, significantly
improving process stability. Furthermore, by tuning the HiPIMS fraction, the plasma parameters can be tuned
continuously and film properties can be optimized. |
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Synchronized trigger signals of HPPMS and MF pulse waveforms and oscilloscope measurement of voltage and current |
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Current and voltage measurement |
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Superimposed HPPMS and MF oscilloscope measurement unipolar (UP) CH1: HPPMS Trigger Signal, CH2: Voltage Measurement, CH3: Current Measurement, CH4: MF Trigger Signal |
Superimposed HPPMS and MF oscilloscope measurement bipolar (BP) CH1: HPPMS Trigger Signal, CH2: Voltage Measurement, CH3: Current Measurement, CH4: MF Trigger Signal |